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A Study on Using AD5933 to Realize Soft-Sensing Measurement of Conductance and Capacitance

机译:利用AD5933实现电导和电容软测量的研究

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摘要

A conductance and capacitance test system was designed in this paper. AD5933 a new chip for impedance testing was used in it. By designing the test system, and testing the impedance of a model, which is a resistor in parallel with a capacitor, under different frequency (range from1000Hz to 100kHz). The information of impedance, real part, and imaginary part of the model under the frequency points were get. Based on this, the internal relations between conductance, capacitance, impedance, real part and imaginary part were carefully analyzed, using the soft-sensing method established the capacitance support vector machine (SVM) regression model on MATLAB. The regression model is the relation between resistance, impedance and capacitance. The test results showed that the test relative error is small in the capacitance range (0.1 pf~33 pf) and the conductance range (9.05~*10-3s~3.8~*10-5s), the biggest, smallest and average test error of capacitance are -2.9%, 0.2%, 1.27% respectively. The study showed that using AD5933 and the soft-sensing method to realize the multi-parameter test is feasible.
机译:本文设计了一种电导和电容测试系统。 AD5933使用了用于阻抗测试的新芯片。通过设计测试系统并测试模型的阻抗,该模型是在不同频率(范围从1000Hz到100kHz)下与电容器并联的电阻。得到了频率点下模型的阻抗,实部和虚部的信息。在此基础上,仔细分析了电导,电容,阻抗,实部和虚部之间的内在联系,采用软传感方法在MATLAB上建立了电容支持向量机(SVM)回归模型。回归模型是电阻,阻抗和电容之间的关系。测试结果表明,在电容范围(0.1 pf〜33 pf)和电导范围(9.05〜* 10-3s〜3.8〜* 10-5s)内,测试相对误差较小,最大,最小和平均测试误差较大。电容的分别为-2.9%,0.2%和1.27%。研究表明,利用AD5933和软检测方法实现多参数测试是可行的。

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