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IN-SITU PHASE DIAGRAM DETERMINATION OF THE HFO_2-TA_2O_5 BINARY UP TO 3000C

机译:高达3000C的HFO_2-TA_2O_5二元原位相图测定

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Ceramic equilibrium phase diagrams have proven to be difficult to produce for materials above 1500 ℃. We demonstrate that in-situ X-ray diffraction on laser heated levitated samples can be used to elucidate phase fields. In these experiments, solid spherical samples are suspended and rotated by a gas stream through a conical nozzle levitator, heated by a 400 W CO_2 laser at Argonne National Labs beamline 6-ID-D. X-ray diffraction patterns suitable for Rietveld refinement were collected at 100℃ temperature intervals and were used to determine the phase fraction of phases present. The temperature of each phase was determined based on thermal expansion data collected by using powder diffraction in conjunction with the Quadrupole Lamp Furnace (QLF) at beamline 33-BM-C. HFO_2-Ta_2O_5 was used as an example system.
机译:事实证明,对于1500℃以上的材料,很难生成陶瓷平衡相图。我们证明了在激光加热的悬浮样品上进行原位X射线衍射可用于阐明相场。在这些实验中,固体球形样品悬浮在锥形喷嘴悬浮器中,并通过气流旋转,并由Argonne National Labs光束线6-ID-D上的400 W CO_2激光器加热。以100℃的温度间隔收集适合Rietveld精制的X射线衍射图,并用于确定存在的相的相分数。每个相的温度是基于热膨胀数据确定的,该数据是通过使用粉末衍射结合四极杆炉(QLF)在光束线33-BM-C处收集的。使用HFO_2-Ta_2O_5作为示例系统。

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