RAY TRACING CALCULATION OF PXR PRODUCED IN CURVED AND FLAT CRYSTALS BY ELECTRON BEAMS WITH LARGE EMITTANCE

摘要

The properties of the parametric X-ray radiation (PXR) produced by beams of relativistic particles passing through flat and bent crystallographic planes have been studied by ray tracing the particles of the incident beam using the well known results on PXR and taking into account multiple scattering. Such calculations are necessary when the electron beam has significant cross section and/or angular spread. As the results of Monte Carlo simulations show in some cases the curved radiators have the advantage that in arrangements like Rowland circles the radiation intensity is much higher than in the case of flat radiators due to PXR focusing. Corresponding experiments are proposed which will confirm the usefulness of microtron and laser produced electron beams for production of monochromatic X-ray beams.