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CVD NANO-CRYSTALLINE TIN OXIDE COATINGS ON GLASS SUBSTRATE: THE EFFECT OF SUBSTRATE TEMPERATURE

机译:玻璃基质上的CVD纳米晶体氧化锡涂层:基质温度的影响

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Tin oxide thin films were grown by chemical vapor deposition (CVD) on glass substrates at atmospheric pressure (AP) and different temperatures of 400, 500 and 600 ℃. The deposition times were also altered from 15 to 60 minutes with 15 minutes time intervals to investigate the effect of deposition time. A horizontal home-made reactor was used for the deposition from SnCl_2 precursors with flowing pure oxygen at a rate 5 ccpm. The structure was analyzed by X-ray diffraction (XRD), scanning electron microscopy (SEM) and atomic force microscopy (AFM) facilities to reveal the deposition mechanisms and crystalline structures. Energy-dispersive spectroscopy (EDS) was conducted to understand the elemental surface composition of the thin films produced. It was detected that the morphology and the oxide structure were changed with deposition time and temperature. The optical and electrical properties were also studied to reveal a relationship between physical properties and production parameters of the resultant thin films.
机译:在大气压(AP)和400、500和600℃的不同温度下,通过化学气相沉积(CVD)在玻璃基板上生长氧化锡薄膜。还以15分钟的时间间隔将沉积时间从15分钟更改为60分钟,以研究沉积时间的影响。将卧式自制反应器用于以5 ccpm的流动纯氧从SnCl_2前驱体进行沉积。通过X射线衍射(XRD),扫描电子显微镜(SEM)和原子力显微镜(AFM)设施对结构进行了分析,以揭示沉积机理和晶体结构。进行了能量色散光谱分析(EDS),以了解所生产薄膜的元素表面组成。据检测,其形貌和氧化物结构随沉积时间和温度而变化。还研究了光学和电学性质以揭示所得薄膜的物理性质和生产参数之间的关系。

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