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A New Pollution Flashover Breakdown Mechanism Theory Which Can Explain the Cause of Unknown-Reason Flashover

机译:一种新的污染闪络分解机理理论,可以解释未知原因闪络的原因

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There has not been an acknowledged theory to explain the cause of the electric conduction process of pollution flashover on the insulators yet. Based on the two existing breakdown mechanism theories, the authors put forward a new theory - the theory of plasmoid shortens the valid insulation distance by which leads to breakdown [1], whose main viewpoint is whether the breakdown occurs depends on the comparing between the valid insulation distance on insulator's surface and the shortened valid insulation distance on insulator's space around by the plasma. Based on the new theory, the conditions of pollution flashover, the development processing and the plasma energy consumption processing after the flashover are given detailedly. According to the mathematics model put forward in literature [1], the emulation for the steady state of polarity local electric arc plasma is made by CFD software-FLUENT. The result shows the exactness of the theory.
机译:尚未有公认的理论来解释绝缘子上污染闪络的导电过程的原因。基于现有的两种击穿机理理论,作者提出了一种新的理论-等离子体技术缩短了导致击穿的有效绝缘距离[1],其主要观点是击穿是否发生取决于有效击穿之间的比较。绝缘体表面上的绝缘距离以及等离子在绝缘体周围空间上缩短的有效绝缘距离。根据新的理论,详细给出了污染物闪蒸的条件,闪蒸后的显影处理和等离子体能耗处理。根据文献[1]中提出的数学模型,用CFD软件FLUENT对极性局部电弧等离子体的稳态进行仿真。结果表明了该理论的正确性。

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