Parametric determination of w-m function for machined surface characterisation

摘要

In contrast to the existing surface analytical method, the technique based on the Weierstrass-Mandelbrot (W-M) function can recognise the pattern of a surface profile spectrum with fractal features and introduces an iterative rather than analytical approach for characterisation of the surface profile of hardened steel turned components. The method generates an artificial spectrum with fractal features on a computer screen to simulate the real surface profile obtained from experimentation. If the simulated spectrum is statistically similar to that of experiment, it can represent the real surface profile and the parameters determined from the W-M function could be used to characterise the surface profile. The work has also investigated the estimation of fractal parameters and how they affect the spectrum. An interactive software package has been developed to implement the simulation which could provide both industry and academics with a means of more accurate assessment of surface measurement.