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Simultaneous measurement of surface profile and thickness variation of transparent parallel plate using wavelength tuning Fizeau interferometer

机译:使用波长调谐菲索干涉仪同时测量透明平行板的表面轮廓和厚度变化

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摘要

In this study, a 6N- 5 phase shifting algorithm comprising a polynomial window function and discrete Fourier transform is developed for the simultaneous measurement of the surface shape and optical thickness of a transparent plate. The characteristics of the 6N - 5 algorithm were estimated by connection with the Fourier representation. The phase error of the measurements performed using the 6N-5 algorithm is discussed and compared with those of measurements obtained using other algorithms. Finally, the surface shape and optical thickness of a transparent plate were measured simultaneously using the 6N-5 algorithm and a wavelength tuning interferometer.
机译:在这项研究中,开发了一种包含多项式窗函数和离散傅立叶变换的6N-5相移算法,用于同时测量透明板的表面形状和光学厚度。通过结合傅立叶表示来估算6N-5算法的特征。讨论了使用6N-5算法执行的测量的相位误差,并将其与使用其他算法获得的测量的相位误差进行了比较。最后,使用6N-5算法和波长调谐干涉仪同时测量透明板的表面形状和光学厚度。

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