Far-field accuracy vs sampliing parameters of a linear array

摘要

The far-field parameters of an antenna are obtaind frm near-Field measurement with an accuracy that is limited by the sampling area and the smpling rate used to collect the measurement data. It is therefore important to know the relation between the far-field parameters and the sampling parameters. A parametric study of the far field parameters accuracy versus the samping parameters was made. In order to determine the optimal choice of the sampling parameters to achieve the desired far-field accuracy, planar near-field measurements of a linear array were performed in an anechoid chamber at the Canadian Space Agency. A program performing Fast-Fourier Transform was used to process the data and to obtain spectral domain and reconstruct the far-field patterns. A methodology developed in [1] was used to compare different spectral and far-field patterns obtained form diffenent sampling conditions. Parameteric curves were developed for the far-field parameters such as gain, beam pointing, beam width, sidelobes, etc.