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Polarimetric calibration of anisotropic materials measurements

机译:各向异性材料测量的极化校准

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摘要

Because the incident wave on an anisotropic material is likely to be depolarized, a complete characterization of scuh a media requires to measure its whole scattering matrix, which afterwards complicates the calibration process. A suitable technic is the Wiesbeck calibration method [1]. In this paper, we apply this method to two configurations, the reflection configuration and the transmission cofiguration, and obtain very good agreements between theoretical and experimental results.
机译:由于各向异性材料上的入射波很可能会去极化,因此要对介质进行完整的表征,需要测量其整个散射矩阵,这会使校准过程复杂化。合适的技术是Wiesbeck校准方法[1]。在本文中,我们将这种方法应用于两种配置,即反射配置和透射配置,并在理论和实验结果之间取得了很好的一致性。

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