WIDE-BAND DUAL POLARIZED PROBES FOR HIGH PRECISION NEAR-FIELD MEASUREMENTS

摘要

High precision near field measurement systems in dual polarization have stringent requirements on the probe performance in terms of radiation pattern shape, on-axis and off-axis polarization purity and port-to-port isolation. In general, these specific requirements can be fulfilled using single polarized probes for narrow frequency bands (about 10% relative bandwidth) and using mechanical rotation for polarization diversity. Consequently, several scaled probes and complicated procedures are necessary to cover the operational frequency band of most common antenna applications leading to inefficient and time-consuming measurement procedures. SATIMO has developed high precision wide-band, dual polarized near field probes covering the frequency range from L to Ka-band to overcome this problem. Two different probe technologies have been applied, each particularly well suited for the appropriate low (L to X-band) and high (X to Ka-band) frequency range. The low frequency probe design is based on a compact corrugated horn with capacitive orthogonal excitations. The high frequency probe design consists of an axially symmetric corrugated horn, a square to circular waveguide transition and a wide-band, high isolation ortho-mode junction (OMJ) exciting the orthogonal polarizations. Probes in C-Band and Ku-band have been delivered to and tested by ALCATEL SPACE INDUSTRIES in their planar near field antenna test range in Toulouse. The C-band probes have operational bandwidths of 25% covering the entire commonly used transmit and receive frequency bands for C-band communication satellites. The Ku-band probes have operational bandwidths of 40% covering the entire commonly used transmit and receive frequency bands for Ku-band communication satellites.