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Investigation into antenna measurement quality from a large compact range operating at Q-band

机译:从在Q波段工作的较大紧凑范围研究天线测量质量

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The utility of a compact range is based, in part, on an acceptable purity of its collimated plane wave generated in a well-defined spatial volume (a.k.a. quiet zone) over a given frequency spectrum. Improvements that broaden the useable frequency spectrum lead to greater utility. This is especially true for a compact range supporting an R&D environment where RF sensor technology is reaching higher and higher into the frequency spectrum. In this paper we investigate performance of the AFRL OneRY Indoor Range in which the upper frequency of operation has been extended from Ku-band to Q-band. Specifically, we analyze field probe data and antenna pattern data to determine measurement quality. Field probe results derived from uniform linear RF sampling in the quiet zone are assessed in terms of taper and ripple metrics for both amplitude and phase. This data is also processed into beamforming representation and compared against a predicted pattern generated using an ideal plane wave. The quality of antenna pattern data is then assessed through two types of measurements. Firstly, antenna gain calibration accuracy is examined by employing a method we coined the dual reference antenna diagnostic. Similar to a dual cylinder calibration employed as a RCS measurement quality assessment, the dual reference antenna approach measures the gain of two different antennas that each has an associated calibration table. Secondly, azimuth pattern measurements are evaluated in regards to dynamic range and null depths. The paper ends with a discussion on planned follow-on efforts to improve measurement capabilities.
机译:紧凑范围的实用性部分基于在给定频谱上在明确定义的空间体积(又称为安静区域)中生成的准直平面波的可接受纯度。扩大可用频谱的改进导致更大的实用性。对于支持R&D环境的紧凑范围尤其如此,其中RF传感器技术正在越来越多地进入频谱。在本文中,我们研究了AFRL OneRY室内范围的性能,在该范围内,操作的上限频率已从Ku频段扩展到Q频段。具体来说,我们分析现场探头数据和天线方向图数据以确定测量质量。根据静区中的均匀线性RF采样得出的现场探头结果,根据幅度和相位的锥度和纹波度量进行评估。此数据也被处理成波束成形表示,并与使用理想平面波生成的预测图案进行比较。然后,通过两种类型的测量来评估天线方向图数据的质量。首先,通过采用我们创造的双参考天线诊断方法来检查天线增益校准精度。与用作RCS测量质量评估的双圆柱校准类似,双参考天线方法可测量两个不同天线的增益,每个天线都有一个相关的校准表。其次,关于动态范围和零位深度评估方位图样测量。本文最后讨论了计划中的后续措施以提高测量能力。

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