Quality Control and In-Line Optical Monitoring for Opaque Films

摘要

As the use of opaque films is growing in the packaging industry, monitoring and quality control have become critical for metallizers. Due to the optical density of the base film and the subsequent deposition of aluminum, most monitoring systems are not capable of maintaining the tight specification required by the end users. The LMS4X-oD monitoring system has been specifically designed for use with opaque films but it also allows the measurement of light transmission of metallized paper used for innerliner or labels. It is capable of measuring up to 4.2 OD with resolution of 0.1% transmission (0.01 OD). This system eliminates the need to use two different monitoring systems and allows for high precision measuring of OD over a wider range.