首页> 外文会议>Advances in X-ray Analysis >DISLOCATION DENSITIES AND CHARACTER EVOLUTION IN COPPER DEFORMED BY ROLLING UNDER LIQUID NITROGEN FROM X-RAY PEAK PROFILE ANALYSIS
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DISLOCATION DENSITIES AND CHARACTER EVOLUTION IN COPPER DEFORMED BY ROLLING UNDER LIQUID NITROGEN FROM X-RAY PEAK PROFILE ANALYSIS

机译:X射线峰形分析中液氮下轧制后铜的位错密度和特征演化

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摘要

The microstructure evolution in pure copper deformed by rolling at liquid nitrogen temperaturernwas determined by using X-ray diffraction peak profile analysis. The crystallite size distributionrnand defects evolution were determined as a function of different reduction levels (e.g. 67%, 74%,rn87%, and 97%). By using the Multiple Whole-Profile (MWP) fitting procedure the Fourierrntransforms of the experimental X-ray peak profiles were fitted all at once by theoreticalrncalculated functions. Here it is assumed that the crystallites are spherical shape and have a lognormalrnsize distribution. It is also supposed that the strain broadening of the profiles is caused byrn<110>{111}-type dislocations. The results show that the median and the variance of therncrystallite size distribution decreases as the deformation reduction increases. The dislocationrndensity has a minim value at 74% reduction. The increase of the dislocation density at higherrndeformation levels is due to the nucleation of new generation of dislocations from the crystalliterngrain boundaries. It was found that the edge dislocation type is predominating the dislocationrnnetwork formed during the deformation process.
机译:通过X射线衍射峰轮廓分析确定了在液氮温度下轧制变形的纯铜的组织演变。确定不同还原水平(例如67%,74%,87%和97%)的晶粒尺寸分布和缺陷演变。通过使用多重整体轮廓(MWP)拟合程序,可以通过理论计算的函数一次拟合实验X射线峰轮廓的Fourierrn变换。在此,假定微晶为球形并且具有对数正态尺寸分布。还可以认为轮廓的应变展宽是由rn <110> {111}型位错引起的。结果表明,随着形变减小,晶粒尺寸分布的中值和方差减小。位错密度在降低74%时具有最小值。在较高的形变水平下,位错密度的增加是由于晶体晶界边界处新一代位错的成核。发现边缘位错类型主要是在变形过程中形成的位错网络。

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  • 来源
    《Advances in X-ray Analysis》|2004年|p.67-72|共6页
  • 会议地点 Steamboat SpringsCO(US);Steamboat SpringsCO(US)
  • 作者单位

    School of Materials Science and Engineering, Georgia Institute of Technology,rnAtlanta, Georgia 30332-0245, USA;

    rnSchool of Materials Science and Engineering, Georgia Institute of Technology,rnAtlanta, Georgia 30332-0245, USA;

    rnSchool of Materials Science and Engineering, Georgia Institute of Technology,rnAtlanta, Georgia 30332-0245, USA;

    rnSchool of Materials Science and Engineering, Georgia Institute of Technology,rnAtlanta, Georgia 30332-0245, USA;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 仪器分析法(物理及物理化学分析法);
  • 关键词

  • 入库时间 2022-08-26 13:46:28

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