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Measurement of Focal Plane for Microlens Array using Metallographic Microscope

机译:用金相显微镜测量微透镜阵列的焦平面

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摘要

Twice-image method based on the Newton's formula, is used to measure the focal plane of the microlens array. The focal plane of the microlens array is measured by using the transmitted optical path, magnification, and high definition of the CCD camera of a metallographic microscope. Both the experimental setup and procedures are described in detail in the paper. Experimental results are also discussed thoroughly as well. It is a simple, convenient and economical method for checking the focal plane of a microlens array efficiently.
机译:基于牛顿公式的两次图像法用于测量微透镜阵列的焦平面。通过使用透射的光路,金相显微镜的CCD相机的放大率和高清晰度来测量微透镜阵列的焦平面。本文详细描述了实验设置和过程。还对实验结果进行了详尽的讨论。这是一种简单,方便且经济的方法,可以有效地检查微透镜阵列的焦平面。

著录项

  • 来源
    《Advances in optics manufacture》|2012年|440-445|共6页
  • 会议地点 Changchun(CN)
  • 作者

    Feng Li; Yiqing Gao; Kejun Zhong;

  • 作者单位

    Key Laboratory of Nondestructive Test (Chinese Ministry of Education), Nanchang Hangkong University, Nanchang, 330063, China,College of Automation Engineering, Nanjing University of Aeronautics and Astronautics, Yudao Road, Nanjing, 210016, China;

    Key Laboratory of Nondestructive Test (Chinese Ministry of Education), Nanchang Hangkong University, Nanchang, 330063, China;

    Key Laboratory of Nondestructive Test (Chinese Ministry of Education), Nanchang Hangkong University, Nanchang, 330063, China,College of Automation Engineering, Nanjing University of Aeronautics and Astronautics, Yudao Road, Nanjing, 210016, China;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    microlens array; focal plane; twice-image method;

    机译:微透镜阵列焦平面两次图像法;

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