A birefringence interferometer for nano-scaled analysis

摘要

In this paper we introduce a new interferometer using birefringence as the beam splitting and recombining elements. The setup is very simple and has high immunity against noise, it can be used to detect displacement of the specimen caused by thermal wave, and any other excite sources, as well as nano-scaled chemical analysis. Some experiments for detecting the displacement of a specimen caused by thermal wave are performed.