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Influence of microstrip line deformation on scattering matrix parameters in strain sensing applications

机译:微带线变形对应变传感应用中散射矩阵参数的影响

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Feeding a microstrip stress sensor using a microstrip line is very common, due to simplicity, ease of production and integration with electronics. In this paper the influence of deformation on microstrip line (ML) feeding microwave strain sensor was studied. This analysis is important for the design and reliability of strain measurement using a microstrip sensor. Finite element method (FEM) was utilized to study this issue. Numerical model in Comsol Multiphysics environment was built and applied for analysis of scattering parameters S11and S21change caused by parallel and perpendicular deformation.
机译:由于具有简单性,易于生产性以及与电子产品集成在一起,因此使用微带线为微带应力传感器供电非常普遍。本文研究了变形对微带线(ML)馈电微波应变传感器的影响。该分析对于使用微带传感器进行应变测量的设计和可靠性至关重要。有限元方法(FEM)被用来研究这个问题。建立了Comsol Multiphysics环境中的数值模型,并将其用于散射参数S \ n 11 \ n和S \ n 21 \ n由平行和垂直变形引起的变化。

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