Comparison test and error analysis of the TEM cell method in IC radiated emission

摘要

Electromagnetic emission measurement aims to provide the level of conducted or radiated emission produced by a device under test (DUT) in a given configuration. The risk of the DUT interfering with the limits defined by a standard or customers, then the DUT is either declared EMC compliance or not. The IEC 61967-2 standard defines a method for measuring the electromagnetic radiation from an integrated circuit (IC). The comparison test was performed in three electromagnetic compatibility (EMC) testing laboratories. Verify the test equipment, test sites, test methods on the test results. Possible causes for variations in emissions with the different systems are discussed, and some improvement measures and precautions have been provided.