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A new FDTD subgridding boundary condition for FDTD subcell lossy thin-layer modeling

机译:FDTD子单元有损薄层建模的新FDTD子网格边界条件

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摘要

In this work we present a novel algorithm based on a subgridding boundary condition, for the subcell treatment of conductive thin-layer in FDTD (SGBC). We show that this technique provides a robust late-time stability behavior, compared to classical impedance boundary condition (IBC) methods, with affordable computer requirements. The method is validated by means of high-frequency scattering problems as well as with low-frequency transfer impedance prediction of tubular shells.
机译:在这项工作中,我们提出了一种基于子网格边界条件的新颖算法,用于FDTD(SGBC)中导电薄层的子单元处理。我们证明,与传统的阻抗边界条件(IBC)方法相比,该技术提供了可靠的后期稳定性行为,并且具有可负担的计算机要求。该方法通过高频散射问题以及管状壳体的低频传递阻抗预测得到了验证。

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