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Sleepy lector: A novel approach for leakage reduction in DSM technology

机译:昏昏欲睡的讲师:DSM技术中减少泄漏的新方法

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Leakage power consumption is a major contribution of total power dissipation in Deep Sub-Micron (DSM) technology for CMOS circuit design. In this paper we have proposed a Novel circuit technique known as ¿¿¿Sleepy LECTOR¿¿¿ which mitigates various type of leakage current in DSM regime. In proposed technique we insert p-type sleep transistor above pull up network, and n-type sleep transistor below pull down network, which rail of from Vdd to GND for reduction of leakage power. Another Leakage controlled transistor (LCTs) PMOS and NMOS inserted between pull up and pull down network, these transistors are always near cut OFF voltage which increases the path resistance from supply to ground reducing leakage power, it is self controlling transistor. Lector transistors produce the stacking effect and producing high resistance path from Vdd to ground. By using Sleep transistors we can turn off the circuit by rail from power supply (Vdd) during standby mode for reduction of leakage power. The proposed circuit technique reduces the Power with respect to basic NAND gate 37.69%, 83.93%, N AND gate with sleep 79.15%, 86.69%, NAND gate with Lector 36.79%, 12.05% respectively in 65nm and 45nm Process Technology.
机译:漏电功耗是用于CMOS电路设计的深亚微米(DSM)技术中总功耗的主要贡献。在本文中,我们提出了一种称为“ Sleepy LECTOR”的新型电路技术,该技术可减轻DSM方案中各种类型的泄漏电流。在提出的技术中,我们在上拉网络上方插入p型睡眠晶体管,并在下拉网络下方插入n型睡眠晶体管,其从Vdd到GND的电压轨可降低泄漏功率。另一个在上拉和下拉网络之间插入的泄漏控制晶体管(LCT)PMOS和NMOS,这些晶体管始终处于截止电压附近,这增加了从电源到地的路径电阻,从而降低了泄漏功率,它是自控晶体管。 Lector晶体管产生堆叠效应,并产生从Vdd到地的高电阻路径。通过使用休眠晶体管,我们可以在待机模式下通过电源(Vdd)的电源将其关断,以减少泄漏功率。所提出的电路技术在65nm和45nm制程技术中,相对于基本NAND门的功耗分别降低了37.69%,83.93%,睡眠的N AND门为79.15%,86.69%,Lector NAND门为36.79%,12.05%。

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