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De-embedding research in cold test of output window of Gyro-TWT (gyro traveling wave tube)

机译:陀螺行波管输出窗口冷测试的去嵌入研究

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In many S-parameter measurements, one would desire to make the measurement with some other setup than what one has. There may be a test fixture required between the normal coaxial calibration planes and the DUT (Device Under Test); it may be useful to see the DUT performance with a certain matching network in place, and may be desired to see what the subsystem performance would be when the given DUT is inserted, etc. One way of handling these chores within the instrument itself is through embedding and de-embedding. The de-embedding technique, it is the process of mathematically subtracting networks from the measured result. This technique has been around for many years and has been subject to a number of refinements to improve accuracy and applicability[1]. The purpose of this article is to discuss the implementation in the broad band TE10-TE01 cruciform mode converter[2], and to provide a number of examples and procedures to show how they can be used to get the required measurement results. This literature aims to provide two kinds of de-embedding techniques to conclude the best suitable method of the converter. Since the S-parameter data for the DUT is available from the measurement and the S-parameter data for the network to be de-embedded is available (either from an s2p file or from a circuit model), if multiplying one transfer matrix by another is equivalent to connecting in the new network, then multiplying by the inverse of that T matrix is equivalent to removing it[3]. The first method is according to the principle above to do the de-embedding work. Based on the principle, this passage has proved that whether the principle is suitable to the microwave measurements through two kinds of methods. It turns out to be that the methods mentioned above can effectively reduce error and is more accurate to the actual value of the DUT when the data which needs to be de-embedded is accurate, but when the data is - esonant, a big error may occur. Except from the above two methods (from one principle), we can also get the actual value by using the other principle, that is to modify the error model parameters to get the actual value. Through repeated measurement, we finally get the required results to estimate the properties of the DUT. Also, through comparative analysis, we find the different results of the S parameter before and after de-embedding, the de-embedding results are obviously better than the ones before de-embedding. Therefore, the de-embedding technique can help us get much more accurate information on the DUT. All in all, the theory and the experiment both illustrate the feasibility and effectiveness of the de-embedding technique.
机译:在许多S参数测量中,人们希望使用其他设置进行测量。在正常的同轴校准平面和DUT(被测设备)之间可能需要测试夹具。可能需要查看具有特定匹配网络的DUT性能,并且可能希望查看在插入给定DUT时子系统的性能如何,等等。在仪器本身中处理这些杂项的一种方法是通过嵌入和反嵌入。去嵌入技术是从测量结果中数学减去网络的过程。这项技术已经存在了很多年,并且已经进行了许多改进以提高准确性和适用性[1]。本文的目的是讨论宽带TE10-TE01十字形模式转换器的实现[2],并提供许多示例和过程来说明如何使用它们来获得所需的测量结果。该文献旨在提供两种去嵌入技术,以得出转换器的最合适方法。由于DUT的S参数数据可以从测量中获得,而待嵌入网络的S参数数据则可以(从s2p文件或电路模型中获得),如果将一个传输矩阵乘以另一个等效于连接到新网络,然后乘以该T矩阵的逆矩阵等效于将其删除[3]。第一种方法是根据上述原理进行去嵌入工作。基于此原理,本文通过两种方法证明了该原理是否适合微波测量。事实证明,当需要去嵌入的数据是准确的时,上述方法可以有效地减少错误,并且更准确地达到DUT的实际值,但是当数据是-esonant时,可能会出现较大的错误发生。除了以上两种方法(从一种原理出发),我们还可以通过另一种原理获得实际值,即修改误差模型参数以获得实际值。通过反复测量,我们最终获得所需的结果以估计DUT的属性。另外,通过比较分析,发现去嵌入前后S参数的结果不同,去嵌入结果明显好于去嵌入前。因此,去嵌入技术可以帮助我们在DUT上获得更准确的信息。总而言之,理论和实验都说明了去嵌入技术的可行性和有效性。

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