Parametric fault diagnosis in analog circuit using genetic algorithm

摘要

This paper presents a new method for diagnosis of parametric faults in analog circuits based on the transfer function of the Circuit Under Test (CUT). Genetic algorithm is used to optimize the system parameters defined in the chromosome. In this method, every system parameter is composed of several components. Components are grouped into suitable modules. Then, genetic algorithm is used to design the filter using system parameters and also to diagnose the fault and it locates the module level fault. The CUT used is Sallen-key band pass filter.