Testing of VLSI chips are becoming very much complex day by day due to increasing exponential advancement of nano technology. So both front-end and back-end engineers are trying to evolve a system with full testability keeping in mind the possibility of reduced product failures and missed market opportunities. BIST is a design technique that allows a system to test automatically itself with slightly larger system size. In this paper, the simulation result performance achieved by BIST enabled UART architecture through VHDL programming is enough to compensate the extra hardware needed in BIST architecture. This technique generate random test pattern automatically, so it can provide less test time compared to an externally applied test pattern and helps to achieve much more productivity at the end.
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