Integrated software environment for high-frequency metrology

摘要

We present an integrated software environment for developing high-frequency measurement procedures. By use of a simple and intuitive graphical user interface, this environment allows to manage all steps of a measurement procedure, i.e., data collection, processing (e.g., instrument calibration, device modeling, uncertainty analysis), and presentation. It the design of the software we put a particular emphasis on portability and ease-of-use. To this end we use the concept of self-contained project files which can easily be transferred to another computer, and use modern database techniques for data management. The software is capable of using all of the computational resources available on a given computer, including multicore processors and graphical processing units. This is particularly important for computationally intensive tasks such as uncertainty analysis. The modular architecture of the software allows to easily extend it with user-provided numerical procedures and database definitions. The software can be run on Windows and Linux/Unix based machines which gives an additional level of portability.