首页> 外文会议>2012 IEEE 10th International Conference on the Properties and applications of Dielectric Materials. >Effect of ATH filler content on the performance of silicone rubber by inclined plane tracking and erosion test method
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Effect of ATH filler content on the performance of silicone rubber by inclined plane tracking and erosion test method

机译:斜面追踪腐蚀实验方法研究ATH填料含量对硅橡胶性能的影响

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摘要

Contamination flashover is a major concern affecting the reliability of power systems. Many utilities have switched over from porcelain and glass insulators to Silicon Rubber (SIR) based polymeric insulators to combat contamination problem. By and large, Aluminum Tri-hydrate (ATH) is used as filler material to improve the tracking and erosion property. The evaluation as per IEC 60587 does not simulate the UV radiation, any particular type of pollutant deposited on the insulator surface and the conductivity of the contaminant more likely to damage the polymeric insulator surface. In the present work, tracking and erosion of silicon rubber material with different proportions of ATH filler content included in its nano form is evaluated. In addition to experimental variables in the IEC 60587 test method site specific variables like UV radiations, hydro carbon pollution (present on the insulator surface due to presence of brick kilns in India) and low severity fog conditions are introduced to the standard test method. The surface resistance and hard ness measurements as well as X -ray diffraction analysis are also made to determine the extent of degradation of the insulator material surface resulted during tracking and erosion test. The study revealed that, the tracking and erosion performance of SIR depends on the proportion of ATH filler and it is found that ATH and silicon in equal parts by weight is the best combination. It is also noticed that incorporating nano ATH filler further improves the performance.
机译:污染闪络是影响电力系统可靠性的主要问题。许多公用事业公司已经从瓷绝缘体和玻璃绝缘体转换为基于硅橡胶(SIR)的聚合物绝缘体,以解决污染问题。总的来说,三水合铝(ATH)被用作填充材料,以改善跟踪和腐蚀性能。根据IEC 60587的评估并未模拟UV辐射,沉积在绝缘子表面的任何特定类型的污染物以及污染物的电导率更可能损坏聚合物绝缘子表面。在本工作中,评估了纳米形式中包含不同比例的ATH填料的硅橡胶材料的跟踪和腐蚀。除了IEC 60587测试方法中的实验变量外,标准测试方法还引入了特定的变量,例如UV辐射,碳氢化合物污染(由于在印度存在砖窑而在绝缘体表面出现)和低雾度条件。还进行了表面电阻和硬度测量以及X射线衍射分析,以确定在跟踪和腐蚀测试过程中导致的绝缘材料表面退化的程度。研究表明,SIR的跟踪和腐蚀性能取决于ATH填料的比例,并且发现ATH和硅等重量份是最佳组合。还注意到,掺入纳米ATH填料进一步改善了性能。

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