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Photoluminescence of porous silicon nanostructures with optimum current density of photo-electrochemical anodisation

机译:具有最佳电流密度的光电化学阳极氧化的多孔硅纳米结构的光致发光

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摘要

P-type silicon wafer (<100> orientation; boron doping; 0.75 ∼ 10 Ωcm−1) was used to prepare samples of porous silicon nanostructures. All the samples have been prepared by using photo-electrochemical anodization. A fixed etching time of 30 minutes and volume ratio of electrolyte, hydrofluoric acid 48% (HF48%) and absolute ethanol (C2H5OH), 1:1 were used for various current densities, J. There were sample A (J=10 mA/cm2), sample B (J=20 mA/cm2), sample C (J=30 mA/cm2), sample D (J=40 mA/cm2) and sample E (J=50 mA/cm2). Photoluminescence (PL) spectra were investigated. Sample B gives the maximum peak position of PL spectrum at ∼675 nm.
机译:使用P型硅片(<100>取向;硼掺杂; 0.75〜10μcm -1 )制备多孔硅纳米结构的样品。所有样品均采用光电化学阳极氧化法制备。固定蚀刻时间为30分钟,电解质,氢氟酸48%(HF48%)和无水乙醇(C 2 H 5 OH)的体积比为1:1用于各种电流密度J。样品A(J = 10 mA / cm 2 ),样品B(J = 20 mA / cm 2 ),样品C (J = 30 mA / cm 2 ),样品D(J = 40 mA / cm 2 )和样品E(J = 50 mA / cm 2 ) / sup>)。研究了光致发光(PL)光谱。样品B在〜675 nm处给出PL光谱的最大峰位置。

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