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A novel method to fabricate full-kerfed highfrequency (>100 MHz) ultrasonic array transducers

机译:制造全切口高频(> 100 MHz)超声阵列换能器的新方法

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High-frequency ultrasonic transducer arrays are essential for efficient imaging in clinical analysis and nondestructive evaluation (NDE). However, the fabrication of piezoelectric transducers is really a great challenge due to the small features in piezoelectric films. This paper describes a novel technique to fabricate thick-film ZnO ultrasonic array transducers. Piezoelectric elements are formed by sputtering thick-film ZnO onto etched features of a silicon substrate so that the difficult etching process for ZnO films is avoided by etching silicon. This process is simple and efficient. A 13-µm-pitch ZnO sandwich array is achieved with a thickness of 8 µm for 300 MHz. Finite element method is employed to calculate its electrical properties, including electrical impedance and crosstalk. The array is characterized by a network analyzer. The measured results are in good agreement with the theoretical predictions.
机译:高频超声换能器阵列对于临床分析和无损评估(NDE)中的高效成像至关重要。然而,由于压电膜的小特征,压电换能器的制造确实是一个巨大的挑战。本文介绍了一种制造厚膜ZnO超声阵列换能器的新技术。通过将厚膜ZnO溅射到硅衬底的蚀刻特征上来形成压电元件,从而通过蚀刻硅避免了ZnO膜的困难蚀刻过程。此过程简单有效。在300 MHz频率下,可获得13μm节距的ZnO夹心阵列,其厚度为8μm。采用有限元法计算其电性能,包括电阻抗和串扰。该阵列的特征在于网络分析仪。测量结果与理论预测吻合良好。

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