首页> 外文会议>2002 International Conference on Modeling and Simulation of Microsystems, Apr 21-25, 2002, San Juan, Puerto Rico, USA >Nanoworld Semiconductor Industry - State and Future Challenges of Technology Computer Aided Design
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Nanoworld Semiconductor Industry - State and Future Challenges of Technology Computer Aided Design

机译:纳米世界半导体产业-技术计算机辅助设计的现状和未来挑战

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摘要

Several application examples of nanoscale techniques used to influence or enhance the understanding of material properties as well as processing behavior are presented. We will also present a review of first principle density functional theory calculations used to investigate the scaling trends of high-k gate dielectrics. Since conventional as well as high-k dielectrics may still require a strong diffusion barrier against boron penetration we will present ab-initio quantum chemical calculations for the diffusion of boron within a thin gate oxide layer. Plasma-nitridation can be applied to alter the diffusion behavior of boron inside the gate oxide dielectric and to completely block boron penetration. We will present a detailed view on the nitridation mechanism and a combination of reactor-feature scale simulations in combination with Monte Carlo implantation simulations to describe the nitridation process. Finally, kinetic Monte Carlo applications are presented for diffusion pro-cesses.
机译:介绍了用于影响或增强对材料特性以及加工行为的理解的纳米级技术的几个应用实例。我们还将介绍用于研究高k栅极电介质的缩放趋势的第一原理密度泛函理论计算。由于常规以及高k电介质可能仍需要强大的扩散阻挡层来阻止硼的渗透,因此我们将提供从头开始的量子化学计算,以计算薄栅氧化层中硼的扩散。可以进行等离子体氮化,以改变硼在栅氧化物电介质内部的扩散行为,并完全阻止硼的渗透。我们将详细介绍氮化机理,并结合反应堆特征规模模拟和蒙特卡洛注入模拟来描述氮化过程。最后,提出了动力学蒙特卡罗方法用于扩散过程。

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