Optimal Design of Microwave NDT Apparatus for Inspecting Adhesive Defects of Sound Absorber Using Genetic Algorithms

摘要

A microwave bridge-type non-destructive test (NDT) apparatus was developed for inspecting defects in adhesive layers of sound absorber in 1997. However, there are always some percentages of test error with the apparatus because of the random variation of construction parameters of the material. For further improvement, Genetic Algorithms (GA) is applied to optimum design of the reference sample of the apparatus. Computer simulation shows there are several cases for making the reference sample to clearly tell defects without error. This conclusion is confirmed by experiments.