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WHY CAN SMART CUT~R CHANGE THE FUTURE OF MICROELECTRONICS?

机译:为什么智能切割会改变微电子的未来?

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摘要

Deposition techniques like chemical vapor deposition (CVD) offer to the semiconductor industry the initial flexibility to deposit thin films of key materials on many kinds of substrates. The homoepitaxy or heteroepitaxy techniques using CVD or molecular beam epitaxy (MBE) add the flexibility to get a pure monocrystalline thin film but with a major limitation: the starting substrate has to be monocrystalline. The missing technology has always been the one which allows the growth of a thin monocrystalline film on any kind of substrate. Hydrogen induced splitting (known today as Smart Cut~R), discovered at the LETI laboratory in 1991, provides a unique opportunity to get crystalline layers on any kind of substrate. Therefore, a new tool is offered to the semiconductor industry, for new material developments and new structures. This technique is in use in production today on a first application: silicon-on-insulator (SOI) wafers which consist of a monocrystalline film of silicon on a thin amorphous silicon dioxide layer, on top of a silicon wafer. We will discuss the SOI application of the Smart Cut~R technology and present other recently demonstrated breakthroughs in new material development, including SiC, compound semiconductor or 3D structures.
机译:诸如化学气相沉积(CVD)之类的沉积技术为半导体行业提供了在多种基板上沉积关键材料薄膜的初始灵活性。使用CVD或分子束外延(MBE)的同质外延技术增加了获得纯单晶薄膜的灵活性,但有一个主要限制:起始基板必须是单晶。缺少的技术一直是允许在任何种类的基板上生长单晶薄膜的技术。 1991年在LETI实验室发现的氢诱导裂解(今天称为Smart Cut_R)为在任何种类的基底上获得结晶层提供了独特的机会。因此,为半导体行业提供了一种用于新材料开发和新结构的新工具。如今,该技术已在生产中首次使用:绝缘体上硅(SOI)晶圆,该晶圆由硅单晶薄膜组成,该单晶硅薄膜位于硅晶圆顶部的非晶硅薄层上。我们将讨论Smart Cut〜R技术的SOI应用,并介绍新材料开发中最近展示的其他突破,包括SiC,化合物半导体或3D结构。

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