首页> 外文会议>International conference on nuclear engineering;ICONE5 >TECHNICAL BASIS FOR ENVIRONMENTAL QUALIFICATION OF SAFETYRELATED MICROPROCESSOR-BASED INSTRUMENTATION AND CONTROL SYSTEMS IN NUCLEAR POWER PLANTS*
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TECHNICAL BASIS FOR ENVIRONMENTAL QUALIFICATION OF SAFETYRELATED MICROPROCESSOR-BASED INSTRUMENTATION AND CONTROL SYSTEMS IN NUCLEAR POWER PLANTS*

机译:核电厂安全相关的基于微处理器的仪表和控制系统的环境认证的技术基础*

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摘要

Because of the increasing unavailability of analogrnreplacements for instrumentation and control (I&C) systems andrnthe potential benefits of digital systems, considerable use of thernsuch technology in safety systems of nuclear power plants (NPPs)rnis likely. While digital technology has several advantages and, inrnfact, has been in widespread use in the non-nuclear industry forrnseveral years, a concern with its use in safety-related systems inrnNPPs is the limited experience with the technology in thesernenvironments. This paper summarizes the results of research,rnsponsored by the U.S. Nuclear Regulatory Commission, into thernenvironmental susceptibility of microprocessor-based I&Crnsystems. This research was conducted by the Oak Ridge NationalrnLaboratory (ORNL) and Sandia National Laboratories (SNL) andrnis intended to provide the supporting technical basis forrnenvironmental qualification of safety-related, microprocessor-rnbased I&C equipment in NPPs. ORNL investigated potentialrnfailure modes and vulnerabilities of microprocessor-based interference and radio-frequency interference, temperature,rnhumidity, and smoke exposure. SNL performed smoke exposurerntests on digital components and circuit boards to determine failurernmechanisms and the effect of different packaging techniques onrnsmoke susceptibility.rntechnologies to environmental stressors, including electromagnetic
机译:由于仪器和控制(I&C)系统的模拟替代品越来越不可用以及数字系统的潜在好处,此类技术可能会在核电厂(NPPs)的安全系统中大量使用。尽管数字技术具有多种优势,并且事实上已经在非核工业领域应用了数年之久,但是在安全相关系统innNPP中使用数字技术的一个关注点是其在环境环境中的经验有限。本文总结了由美国核监管委员会赞助的对基于微处理器的I&Crnsystems在环境中的敏感性研究的结果。这项研究是由橡树岭国家实验室(ORNL)和桑迪亚国家实验室(SNL)进行的,旨在为核电厂中与安全相关的,基于微处理器的I&C设备的环境鉴定提供支持的技术基础。 ORNL研究了基于微处理器的干扰和射频干扰,温度,湿度和烟雾暴露的潜在失效模式和漏洞。 SNL在数字元器件和电路板上进行了烟雾暴露测试,以确定故障机理以及不同包装技术对烟气敏感性的影响。对环境压力源的技术,包括电磁

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  • 来源
  • 会议地点 Nice(FR);Nice(FR)
  • 作者单位

    Oak Ridge National LaboratoryrnPost Office Box 2008rnOak Ridge, TN 37831-6010 USArn(423) 576-6064rnkorsahk@ornl.gov;

    U.S. Nuclear Regulatory Commissionrn11545 Rockville PikernRockville, MD 20852 USArn(301) 415-6792rncea1@nrc.gov;

    Sandia National LaboratoriesrnPost Office Box 5800rnAlbuquerque, NM 87185-0747 USArn(505) 844-2981rntjtanak@sandia.gov;

    Oak Ridge National LaboratoryrnPost Office Box 2008rnOak Ridge, TN 37831-6010 USArn(423) 574-5578rnwoodrt@ornl.gov;

  • 会议组织
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 核反应堆工程;
  • 关键词

  • 入库时间 2022-08-26 14:02:03

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