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LIFE TEST AND ELECTROMAGNETIC SHIELDING PERFORMANCE EVALUATION OF EMI GASKETS

机译:EMI垫片的寿命测试和电磁屏蔽性能评估

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摘要

MIL-G-83528B, ASTM 4935-89 and JSS 52100 are some of the specifications used in evaluating the performance of EMI/RFI/EMP gaskets. These gaskets are used to maintain the Electromagnetic (EM) shielding integrity in shielded enclosures. A number of test methods are being developed and evaluated to measure accurately EM shielding or volume resistivity of the test samples before and after life test. The measurement methods for volume resistivity given in specifications are standard and accurate. Unfortunately, measurement methods for EM shielding has its own quirks and there is a large variation in shielding performance data from method to method for the same type of EMI gaskets. Besides, measurements procedures and the interpretation of test results have their own problems. It is very difficult to get accurately repeatable results using the same EMI gasket not only in various techniques but also in the same technique in the same test conditions and configurations. Therefore, the use of an EMI gasket on the basis of measurement results in a practical application may cause a severe interference problems.
机译:MIL-G-83528B,ASTM 4935-89和JSS 52100是用于评估EMI / RFI / EMP垫圈性能的一些规范。这些垫圈用于在屏蔽罩中保持电磁(EM)屏蔽的完整性。正在开发和评估多种测试方法,以在寿命测试之前和之后准确地测量测试样品的EM屏蔽或体积电阻率。规格中给出的体积电阻率的测量方法是标准且准确的。不幸的是,用于EM屏蔽的测量方法有其自身的特点,对于相同类型的EMI垫圈,每种方法的屏蔽性能数据差异很大。此外,测量程序和测试结果的解释也有其自身的问题。不仅在各种技术中而且在相同的测试条件和配置下使用相同的技术,使用相同的EMI垫圈都很难获得准确的可重复结果。因此,在实际应用中根据测量结果使用EMI垫圈可能会导致严重的干扰问题。

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