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Trends in Ultralow-Voltage RAM Technology

机译:超低压RAM技术的趋势

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摘要

This paper describes ultralow-voltage RAM technology for standalone and embedded memories in terms of signal-to-noise-ratio designs of RAM cells and subthreshold-current reduction. First, structures and areas of current DRAM and SRAM cells are discussed. Next, low-voltage peripheral circuits that have been proposed so far are reviewed with focus on subthreshold-current reduction, speed variation, on-chip voltage conversion, and testing. Finally, based on the above discussion, a perspective is given with emphasis on needs for high-speed simple non-volatile RAMs, new devices/circuits for reducing active-mode leakage currents, and memory-rich SOC architectures.
机译:本文从RAM单元的信噪比设计和亚阈值电流降低的角度描述了用于独立和嵌入式存储器的超低压RAM技术。首先,讨论了当前DRAM和SRAM单元的结构和面积。接下来,对目前已提出的低压外围电路进行综述,重点是降低亚阈值电流,速度变化,片上电压转换和测试。最后,基于以上讨论,给出了对高速简单非易失性RAM,用于降低有源模式泄漏电流的新设备/电路以及存储器丰富的SOC体系结构的需求的观点。

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