A size sensitivity method for interactive MOS circuit sizing

摘要

A device size sensitivity method is proposed for metal oxide semiconductor (MOS) analog circuit sizing. The sensitivity computation issues are discussed in detail. It is pointed out that the dc sensitivity is important for the accuracy of size-referred ac sensitivity. Moreover, it is highlighted that a symbolic approach to ac sensitivity computation is advantageous for interactive sizing. Emphasis is placed on the behavioral intuition extractable from the ac sensitivity to device sizes. The basic principle developed in this work is believed useful for developing a semi-automatic and interactive analog sizing tool. An EKV model based design example shows how the proposed procedure can be used for interactive circuit sizing.