Polytetrafluoroethylene (PTFE) is a kind of insulating material, which has been widely used in communication equipments and high voltage apparatus age to its excellent insulating property. On one hand the electrical ageing phenomenon of PTFE may cause insulation failure under nanosecond pulses, on the other hand precision insulation design ask knowing about temperature influence on electrical ageing behavior of PTFE. In this paper, the temperature effect on the electrical ageing characteristics of PTFE is investigated. A solid-state pulse generator MPCSOD is used as source supply to export nanosecond pulses, the rise time of which is 30ns and the full width at half maximum of which is 70ns. Needle is used to accelerate the procedure of the ageing. Electrical trees in different cases are shown in Figure 1 and Figure 2.
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