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Room temperature transparent conducting magnetic oxide (TCMO) properties in heavy ion doped oxide semiconductor

机译:重离子掺杂氧化物半导体中的室温透明导电磁性氧化物(TCMO)特性

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Bismuth doped ZnO (ZnBi0.03O0.97) thin films are grown using pulsed laser deposition. The existence of positively charged Bi, absence of metallic zinc and the Zn-O bond formation in Bi doped ZnO are confirmed using X-ray Photoelectron Spectroscopy (XPS). Temperature dependent resistivity and UV-visible absorption spectra show lowest resistivity with 8.44 × 10-4 Ω cm at 300 K and average transmittance of 93 % in the visible region respectively. The robust ferromagnetic signature is observed at 350 K (7.156 × 10-4 emu/g). This study suggests that Bi doped ZnO films should be a potential candidate for spin based optoelectronic applications.
机译:使用脉冲激光沉积生长铋掺杂的ZnO(ZnBi 0.03 O 0.97 )薄膜。使用X射线光电子能谱(XPS)证实了Bi掺杂的ZnO中存在带正电的Bi,金属锌不存在和Zn-O键形成。温度相关的电阻率和紫外可见吸收光谱在300 K处的电阻率最低,为8.44×10 -4 Ωcm,可见光区的平均透射率分别为93%。在350 K(7.156×10 -4 emu / g)处观察到了强大的铁磁签名。这项研究表明,Bi掺杂的ZnO薄膜应该是自旋基光电应用的潜在候选者。

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