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Growth and electronic properties of Ge-Si_xGe_(1-x) core-shell nanowire heterostructures

机译:Ge-Si_xGe_(1-x)核-壳纳米线异质结构的生长和电子性质

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We report the growth and characterization of Ge-Si_xGe_(1-x) core-shell nanowires. Using a combination of vapor-liquid-solid nanowire growth and ultra-high-vacuum chemical vapor deposition conformal growth, we demonstrate the realization of epitaxial Ge-Si_xGe_(1-x) core-shell nanowire heterostmctures with tunable shell content. We investigate the intrinsic electronic properties of Ge-Si_xGe_(1-x) core-shell nanowires using back-gate dependent two- and four-terminal resistance measurements, and demonstrate high performance Ge-Si_xGe_(1-x) core-shell nanowire field-effect transistors with highly doped source and drain.
机译:我们报告了Ge-Si_xGe_(1-x)核壳纳米线的生长和表征。结合使用汽-液-固纳米线生长和超高真空化学气相沉积共形生长,我们证明了具有可调壳含量的外延Ge-Si_xGe_(1-x)核壳纳米线异质结构的实现。我们使用背栅相关的二端和四端电阻测量研究了Ge-Si_xGe_(1-x)核-壳纳米线的固有电子性能,并展示了高性能Ge-Si_xGe_(1-x)核-壳纳米线场高掺杂源极和漏极的高效率晶体管。

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