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Growth and electronic properties of Ge-Si_xGe_(1-x) core-shell nanowire heterostructures

机译:Ge-Si_xge_(1-x)核心壳纳米线异质结构的生长和电子性质

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We report the growth and characterization of Ge-Si_xGe_(1-x) core-shell nanowires. Using a combination of vapor-liquid-solid nanowire growth and ultra-high-vacuum chemical vapor deposition conformal growth, we demonstrate the realization of epitaxial Ge-Si_xGe_(1-x) core-shell nanowire heterostmctures with tunable shell content. We investigate the intrinsic electronic properties of Ge-Si_xGe_(1-x) core-shell nanowires using back-gate dependent two- and four-terminal resistance measurements, and demonstrate high performance Ge-Si_xGe_(1-x) core-shell nanowire field-effect transistors with highly doped source and drain.
机译:我们报告了Ge-Si_xGe_(1-x)核心壳纳米线的增长和表征。使用汽液固体纳米线生长和超高真空化学气相沉积的组合,我们证明了具有可调谐壳含量的外延Ge-Si_xge_(1-x)核心壳纳米线异常的实现。我们使用背栅依赖于两端和四端电阻测量来研究Ge-Si_xge_(1-x)核心 - 壳纳米线的内在电子特性,并演示高性能Ge-Si_xge_(1-x)核心壳纳米线字段 - 具有高掺杂源极和漏极的晶体管。

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