首页> 外文会议>European workshop of the European Microbeam Analysis Society (EMAS) on modern developments and applications in microbeam analysis >Quantitative EDS analysis in transmission electron microscopy using unconventional reference materials
【24h】

Quantitative EDS analysis in transmission electron microscopy using unconventional reference materials

机译:使用非传统参考材料的透射电子显微镜测量EDS分析

获取原文

摘要

This work investigates the use of an unconventional reference material to determine experimentally the Cliff-Lorimer factor for EDS quantitative analysis with a transmission electron microscope. The results demonstrate the equivalence of a bi-layer of pure gold on pure silver with respect to a binary alloy foil of the same elements. RF-sputtering is a suitable technique to prepare such reference materials that have a uniform thickness within a few percent tolerance. The availability of a calibrated set of similar reference materials would allow direct measurement of the k-factors for a large number of elements. This would avoid the errors due to the use of theoretical it-factors extracted from the compilations available in the literature. A new expression of the correction factor for X-ray self-absorption of the sample has also been derived.
机译:这项工作调查了使用非传统参考材料来确定EDS用透射电子显微镜的定量分析的悬崖储层因子。结果证明了纯银相对于相同元素的二元合金箔上的纯银上的双层的等价性。 RF-溅射是制备在少量耐受性范围内均匀厚度的这种参考材料的合适技术。校准的类似参考资料集的可用性将允许直接测量大量元素的k因素。这将避免由于使用文献中可用的编译中提取的理论IT因素而导致的错误。还推导出样品的X射线自吸收的校正因子的新表达。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号