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首页> 外文期刊>Applied optics >LIGHT-INDUCED REFRACTIVE-INDEX MODIFICATIONS IN DIELECTRIC THIN FILMS - EXPERIMENTAL DETERMINATION OF RELAXATION TIME AND AMPLITUDE
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LIGHT-INDUCED REFRACTIVE-INDEX MODIFICATIONS IN DIELECTRIC THIN FILMS - EXPERIMENTAL DETERMINATION OF RELAXATION TIME AND AMPLITUDE

机译:介电薄膜的光致折光指数修改-松弛时间和幅值的实验测定

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摘要

A two-beam setup based on the totally reflecting prism coupler is shown to be a powerful means of characterizing light-induced refractive-index modifications in dielectric thin films. Rise and relaxation times and amplitudes of thin-film refractive-index variations can be measured. Some developments of the electromagnetic theory of prism coupling are presented for Gaussian incident beams. Measurements made on a single Ta2O5 layer deposited on a silica glass are presented. Relaxation times of a few milliseconds reveal the thermal origin of the phenomena. The thermal nonlinear coefficient of this Ta2O5 layer is nearly 10(-15) m(2)/W. (C) 1996 Optical Society of America [References: 18]
机译:显示了基于全反射棱镜耦合器的两光束设置,是表征介电薄膜中光诱导的折射率变化的有力手段。可以测量薄膜折射率变化的起伏和松弛时间以及振幅。提出了高斯入射光束棱镜耦合电磁理论的一些进展。提出了在沉积在石英玻璃上的单个Ta2O5层上进行的测量。几毫秒的弛豫时间揭示了现象的热源。该Ta2O5层的热非线性系数接近10(-15)m(2)/ W。 (C)1996年美国眼镜学会[参考文献:18]

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