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首页> 外文期刊>ACS applied materials & interfaces >Ultrasensitive Near-Infrared Photodetectors Based on a Graphene-MoTe2-Graphene Vertical van der Waals Heterostructure
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Ultrasensitive Near-Infrared Photodetectors Based on a Graphene-MoTe2-Graphene Vertical van der Waals Heterostructure

机译:基于石墨烯-MOTE2-石墨烯垂直范德瓦尔斯异质结构的超声敏感近红外光电探测器

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摘要

Graphene and other layered materials, such as transition metal dichalcogenides, have rapidly established themselves as exceptional building blocks for optoelectronic applications because of their unique properties and atomically thin nature. The ability to stack them into van der Waals (vdWs) heterostructures with new functionality has opened a new platform for fundamental research and device applications. Nevertheless, near-infrared (NIR) photodetectors based on layered semiconductors are rarely realized. In this work, we fabricate a graphene-MoTe2-graphene vertical vdWs heterostructure on a SiO2/p(+)-Si substrate by a facile and reliable site-controllable transfer method and apply it for photodetection from the visible to NIR wavelength range. Compared to the layered semiconductor photodetectors reported thus far, the graphene-MoTe2-graphene photodetector has a superior performance, including high photoresponsivity (similar to 110 mA W-1 at 1064 nm and 205 mA W-1 at 473 nm), high external quantum efficiency (EQE; similar to 12.9% at 1064 nm and similar to 53.8% at 473 nm), rapid response and recovery processes (a rise time of 24 mu s and a fall time of 46 mu s under 1064 nm illumination), and free from an external source-drain power supply. We have employed scanning photocurrent microscopy to investigate the photocurrent generation in this heterostructure under various back-gate voltages and found that the two Schottky barriers between the graphenes and MoTe2 play an important role in the photocurrent generation. In addition, the vdWs heterostructure has a uniform photoresponsive area. The photoresponsivity and EQE of the photodetector can be modulated by the back-gate (p(+)-Si) voltage. We compared the responsivities of thin and thick flakes and found that the responsivity had a strong dependence on the thickness. The heterostructure has promising applications in future novel optoelectronic devices, enabling next-generation high-responsivity, high-speed, flexible, and transparent NIR devices.
机译:石墨烯和其他层状材料,例如过渡金属二甲基甲基化物,由于其独特的性质和原子上薄的性质而迅速建立为光电应用的特殊构建块。将其堆叠到Van der Waals(VDWS)异质结构的能力为新功能开辟了基本研究和设备应用的新平台。然而,基于分层半导体的近红外(NIR)光电探测器很少实现。在这项工作中,我们通过容易和可靠的位点可控传递方法在SiO 2 / P(+) - Si衬底上制造石墨烯-Mote2-石墨烯垂直VDWS异质结构,并将其应用于从可见的NIR波长范围的光电检测。与迄今为止报道的分层半导体光电探测器相比,石墨烯-MOTE2-石墨烯光电探测器具有优异的性能,包括高光反应性(类似于1064nm和473nm的1064nm和205 mA W-1的110 mA W-1),高外部量子效率(EQE;类似于1064nm的12.9%,类似于473nm的53.8%),快速响应和恢复过程(上升时间为24亩,下降时间为46亩,低于1064nm照明),并自由从外部源排水电源。我们使用扫描光电流显微镜,以在各种后栅电压下研究这种异质结构中的光电流产生,并发现图形和Mote2之间的两个肖特基屏障在光电流中发挥着重要作用。另外,VDWS异质结构具有均匀的光散射区域。光电探测器的光响应性和EQE可以由后栅极(P(+) - Si)电压调制。我们比较了薄薄的薄片的响应,并发现反应性对厚度具有很强的依赖性。异质结构在未来的新型光电器件中具有希望的应用,可实现下一代高响应度,高速,柔性和透明的NIR器件。

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