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首页> 外文期刊>ACS nano >Determination of the metallic/semiconducting ratio in bulk single-wall carbon nanotube samples by cobalt porphyrin probe electron paramagnetic resonance spectroscopy
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Determination of the metallic/semiconducting ratio in bulk single-wall carbon nanotube samples by cobalt porphyrin probe electron paramagnetic resonance spectroscopy

机译:钴卟啉探针电子顺磁共振波谱法测定单壁碳纳米管本体样品中的金属/半导体比

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摘要

A simple and quantitative, self-calibrating spectroscopic technique for the determination of the ratio of metallic to semiconducting single-wall carbon nanotubes (SWCNTs) in a bulk sample is presented. The technique is based on the measurement of the electron paramagnetic resonance (EPR) spectrum of the SWCNT sample to which cobalt(II)octaethylporphyrin (CoOEP) probe molecules have been added. This yields signals from both CoOEP molecules on metallic and on semiconducting tubes, which are easily distinguished and accurately characterized in this work. By applying this technique to a variety of SWCNT samples produced by different synthesis methods, it is shown that these signals for metallic and semiconducting tubes are independent of other factors such as tube length, defect density, and diameter, allowing the intensities of both signals for arbitrary samples to be retrieved by a straightforward least-squares regression. The technique is self-calibrating in that the EPR intensity can be directly related to the number of spins (number of CoOEP probe molecules), and as the adsorption of the CoOEP molecules is itself found to be unbiased toward metallic or semiconducting tubes, the measured intensities can be directly related to the mass percentage of metallic and semiconducting tubes in the bulk SWCNT sample. With the use of this method it was found that for some samples the metallic/semiconducting ratios strongly differed from the usual 1:2 ratio.
机译:提出了一种简单,定量,自校准的光谱技术,用于测定大体积样品中金属与半导体的单壁碳纳米管(SWCNT)的比例。该技术基于SWCNT样品的电子顺磁共振(EPR)光谱的测量,该样品已添加了钴(II​​)八乙基卟啉(CoOEP)探针分子。这会从金属管和半导体管上的CoOEP分子中产生信号,这些信号在这项工作中容易区分和准确表征。通过将该技术应用于通过不同合成方法生产的各种SWCNT样品,表明金属和半导体管的这些信号与其他因素(例如管长,缺陷密度和直径)无关,从而允许两种信号的强度通过直接的最小二乘回归获取任意样本。该技术是自校准的,因为EPR强度可以直接与自旋数(CoOEP探针分子的数量)相关,并且由于发现CoOEP分子的吸附本身不偏向金属或半导体管,因此可以测量强度可以与SWCNT样品中金属管和半导体管的质量百分比直接相关。通过使用该方法,发现对于一些样品,金属/半导体比与通常的1:2比有很大差异。

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