The Ehrlich-Schwoebel barrier on an oxide surface: a combined Monte-Carlo and in situ scanning tunneling microscopy approach (vol 45, 455705, 2015)

Vasudevan Rama K.; Tselev Alexander; Baddorf Arthur P.; Kalinin Sergei V.

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The Ehrlich-Schwoebel barrier on an oxide surface: a combined Monte-Carlo and in situ scanning tunneling microscopy approach (vol 45, 455705, 2015)

机译：氧化物表面上的Ehrlich-Schwoebel势垒：蒙特卡洛和原位扫描隧道显微镜相结合的方法（第45卷，455705，2015）

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《Nanotechnology》 |2016年第18期|共2页
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Vasudevan Rama K.; Tselev Alexander; Baddorf Arthur P.; Kalinin Sergei V.;
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1. The Ehrlich-Schwoebel barrier on an oxide surface: a combined Monte-Carlo and in situ scanning tunneling microscopy approach (vol 45, 455705, 2015) [J] . Vasudevan Rama K., Tselev Alexander, Baddorf Arthur P., Nanotechnology . 2016,第18期

机译：氧化物表面上的Ehrlich-Schwoebel势垒：蒙特卡洛和原位扫描隧道显微镜相结合的方法（第45卷，455705，2015）
2. Atomically flat aluminum-oxide barrier layers constituting magnetic tunnel junctions observed by in situ scanning tunneling microscopy [J] . M. Mizuguchi, Y. Suzuki, T. Nagahama, Applied Physics Letters . 2005,第17期

机译：通过原位扫描隧道显微镜观察到的构成磁性隧道结的原子平坦的氧化铝阻挡层
3. Study of Resonant Tunneling in Au Nanoclusters on the Surface of Si02/Si Thin Films Using the Combined Scanning Tunneling Microscopy and Atomic-Force Microscopy Technique [J] . M. A. Lapshina, D. O. Filatov, D. A. Antonov, Journal of surface investigation: x-ray, synchrotron and neutron techniques . 2009,第4期

机译：结合扫描隧道显微镜和原子力显微镜技术研究SiO 2 / Si薄膜表面金纳米团簇中的共振隧穿
4. In situ scanning tunneling microscopy: nanostructuring of solid state surfaces and determination of surface properties [C] . Werner Schindler, Philipp Hugelmann, Martin Hugelmann International symposium on magnetic materials, processes, and devices with applications in storage and micro-electro-mechanical systems . 2003

机译：原位扫描隧穿显微镜：固态表面的纳米结构和表面性质的测定
5. Scanning tunneling microscopy studies of growth medium & temperature dependent structural phases of alkanethiol self-assembled monolayers, reactive self-assembled monolayers, & flat gold nanoparticle/indium tin oxide substrates and a scanning surface photovoltage microscopy study for local mechanical stress characterization in complementary metal oxide semiconductor devices. [D] . Dahanayaka, Dahanayaka Liyanage Daminda Hemal. 2010

机译：烷烃硫醇自组装单分子层，反应性自组装单分子层，扁平金纳米颗粒/铟锡氧化物基质的生长介质和温度依赖性结构相的扫描隧道显微镜研究，以及互补金属氧化物中局部机械应力表征的扫描表面光电压显微镜研究半导体器件。
6. Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy [O] . Thomas König, Georg H Simon, Lars Heinke, 2015

机译：通过原子力和扫描隧道显微镜研究氧化物表面的缺陷
7. In situ electrochemical scanning tunneling microscopy study of the structural changes of silver surfaces following an oxidation-reduction cycle in 1M KCl [O] . J.-S. Chen, T.M. Devine, D.F. Ogletree, 1991

机译：原位电化学扫描隧道显微镜显微镜研究了1M KCl中氧化减少循环后银表面的结构变化
8. Atomic-Resolution Scanning Tunneling Microscopy and Infrared Spectroscopy as Combined In-Situ Probes of Electrochemical Adlayer Structure: Carbon Monoxide on Rhodium(111). [R] . Yau, S. L., Gao, X., Chang, S. C., 1991

机译：原子分辨率扫描隧道显微镜和红外光谱作为电化学附着层结构的原位探针：铑上的一氧化碳（111）。

The Ehrlich-Schwoebel barrier on an oxide surface: a combined Monte-Carlo and in situ scanning tunneling microscopy approach (vol 45, 455705, 2015)

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