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Experimental study and analytical model of deformation of magnetostrictive films as applied to mirrors for x-ray space telescopes

机译:X射线空间望远镜反射镜上磁致伸缩薄膜变形的实验研究与分析模型

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The desire for continuously gaining new knowledge in astronomy has pushed the frontier of engineering methods to deliver lighter, thinner, higher quality mirrors at an affordable cost for use in an x-ray observatory. To address these needs, we have been investigating the application of magnetic smart materials (MSMs) deposited as a thin film on mirror substrates. MSMs have some interesting properties that make the application of MSMs to mirror substrates a promising solution for making the next generation of x-ray telescopes. Due to the ability to hold a shape with an impressed permanent magnetic field, MSMs have the potential to be the method used to make light weight, affordable x-ray telescope mirrors. This paper presents the experimental setup for measuring the deformation of the magnetostrictive bimorph specimens under an applied magnetic field, and the analytical and numerical analysis of the deformation. As a first step in the development of tools to predict deflections, we deposited Terfenol-D on the glass substrates. We then made measurements that were compared with the results from the analytical and numerical analysis. The surface profiles of thin-film specimens were measured under an external magnetic field with white light interferometry (WLI). The analytical model provides good predictions of film deformation behavior under various magnetic field strengths. This work establishes a solid foundation for further research to analyze the full three-dimensional deformation behavior of magnetostrictive thin films.
机译:不断获得天文学新知识的愿望推动了工程方法的前沿,以负担得起的成本提供更轻,更薄,更高质量的镜子,以用于X射线天文台。为了满足这些需求,我们一直在研究在镜子基板上沉积为薄膜的磁性智能材料(MSM)的应用。 MSM具有一些有趣的特性,这些特性使MSM在镜面基板上的应用成为制造下一代X射线望远镜的有希望的解决方案。由于具有在外加永久磁场下保持形状的能力,MSM有望成为制造轻便,价格合理的X射线望远镜镜的方法。本文介绍了在施加磁场的情况下测量磁致伸缩双压电晶片样品变形的实验装置,以及变形的解析和数值分析。作为开发预测挠度的工具的第一步,我们将Terfenol-D沉积在玻璃基板上。然后,我们进行了测量,并与分析和数值分析的结果进行了比较。薄膜样品的表面轮廓是在外部磁场下用白光干涉仪(WLI)测量的。该分析模型为各种磁场强度下的薄膜变形行为提供了良好的预测。这项工作为进一步研究磁致伸缩薄膜的三维变形行为奠定了坚实的基础。

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