Extraction of phase derivative data from interferometer images using a continuous wavelet transform to determine two-dimensional refractive index profiles

摘要

Two-dimensional refractive index profiles of ion exchanged channel waveguides in glass have been obtained from the analysis of interferometer data. To obtain depth data, a shallow bevel is produced in the glass by polishing. The refractive index profile information that is contained within the derivative of the phase data is extracted directly using a continuous wavelet transform algorithm. The algorithm used to characterize and smooth the wavelet ridge is discussed in detail.