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首页> 外文期刊>Angewandte Chemie >Use of In Situ Atomic Force Microscopy to Follow Phase Changes at Crystal Surfaces in Real Time
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Use of In Situ Atomic Force Microscopy to Follow Phase Changes at Crystal Surfaces in Real Time

机译:使用原位原子力显微镜实时跟踪晶体表面的相变

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摘要

Atomic force microscopy can be used to identify and observe phase changes at crystal surfaces where the transformation is accompanied by a change in the spacing between layers of molecules. The conversion of a metastable polymorph of the caffeine-glutaric acid cocrystal to the thermodynamically stable form was analyzed continuously in situ using intermittent contact-mode atomic force microscopy (IC-AFM), allowing the mechanism by which molecules move during the transformation to be determined.
机译:原子力显微镜可用于识别和观察晶体表面的相变,其中相变伴随着分子层之间的间距变化。使用间歇接触模式原子力显微镜(IC-AFM)连续原位连续分析咖啡因-戊二酸共晶体的亚稳态多晶型物向热力学稳定形式的转化,从而确定分子在转化过程中移动的机理。

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