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首页> 外文期刊>IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control >(Electro-) mechanical characteristics of electrostatically drivenvacuum encapsulated polysilicon resonators
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(Electro-) mechanical characteristics of electrostatically drivenvacuum encapsulated polysilicon resonators

机译:静电驱动真空封装的多晶硅谐振器的(电)机械特性

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摘要

The design, fabrication and performance of vacuum-encapsulatednelectrostatically driven polysilicon resonating beams, 210-510 Μmnlong, 100 Μm wide, and 1.5 Μm thick, are described. The shortestnbeams have a fundamental frequency of 324 kHz, a gauge factor of 2400nand a quality factor of 600 at cavity pressures of 0.15 mbar. Intrinsicnquality factors of 18000 were measured below 0.01 mbar
机译:描述了210-510微米长,100微米宽和1.5微米厚的真空封装的静电驱动多晶硅谐振梁的设计,制造和性能。最短光束的基本频率为324 kHz,在腔压为0.15 mbar时的规格系数为2400n,质量系数为600。在0.01 mbar以下测量了18000的本征品质因数

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