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首页> 外文期刊>IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control >Experimental study of construction mechanism of V(z) curvesobtained by line-focus-beam acoustic microscopy
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Experimental study of construction mechanism of V(z) curvesobtained by line-focus-beam acoustic microscopy

机译:线聚焦束声学显微镜获得V(z)曲线构造机理的实验研究

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摘要

The propagation characteristics, viz., phase velocity andnattenuation, of leaky surface acoustic waves (LSAWs), excited on thenwater/sample boundary are obtained through analyzing the V(z) curvesnmeasured by line-focus-beam acoustic microscopy. However, differentnvalues of these characteristics are obtained, depending upon differentnultrasonic devices and operating frequencies employed. The constructionnmechanism of V(z) curves was investigated experimentally by measuringnthe amplitude and phase for Teflon to provide an understanding of thendevice performance for velocity measurements. A V(z) curve measured fornTeflon, on which no leaky waves are excited when water is the couplingnmedium, can be used for the characteristic device response, dependingnonly upon the device parameters and the operating frequencies. From theninvestigation of the ultrasonic device and the frequency dependences ofnthe characteristic device responses, the phase gradient was found to bendirectly related to values of measured LSAW velocities. From thisnresult, apparent frequency dependences in LSAW velocity measurements arenexplained quantitatively for a specimen of gadolinium gallium garnet
机译:通过分析线聚焦束声学显微镜测得的V(z)曲线,得到在水/样品边界上激发的泄漏表面声波(LSAW)的传播特性,即相速度和n衰减。然而,取决于不同的超声设备和所使用的工作频率,获得了这些特性的不同值。通过测量特富龙的幅度和相位,实验研究了V(z)曲线的构造机理,从而了解了用于速度测量的设备性能。对于nTeflon测得的V(z)曲线可用于特征器件响应,该过程在水为耦合钕时不会激发泄漏波,这取决于器件参数和工作频率。通过对超声设备的研究以及特征设备响应的频率依赖性,发现相位梯度与LSAW速度的测量值没有直接关系。因此,无法定量解释L镓石榴石样品在LSAW速度测量中的明显频率依赖性。

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