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A simple method for subtracting background from elemental maps of scanning proton microprobe

机译:从扫描质子微探针元素图减去背景的简单方法

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摘要

At present, the conventional elemental mapping method for routine scanning proton microprobe analyses is the TCEW method. With this method, the elemental maps are obtained by making use of the total counts entering a simple energy window on an X-ray peak. The fatal disadvantage of this method is that the total counts entering an energy window contain the contribution of continuum background. Even when the element of interest is absent, the variation in the intensity of the background within the energy can masquerade as the distribution of the element. Hence some famous international SPM laboratories are setting about a study of the true elemental mapping methods.
机译:目前,用于常规扫描质子微探针分析的常规元素映射方法是TCEW方法。通过这种方法,元素图通过利用进入X射线峰上的简单能量窗口的总计数获得。该方法的致命缺点是进入能​​量窗口的总计数包含连续背景的贡献。即使不存在感兴趣的元素,能量中背景强度的变化也可能会随着元素的分布而被伪装。因此,一些著名的国际SPM实验室正在着手研究真正的元素映射方法。

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