RECENT DEVELOPMENTS IN TRUE-ELEMENTAL IMAGING ON THE FUDAN SCANNING PROTON MICROPROBE

摘要

Many efforts have been paid for the production of true-elemental images using PIXE (Proton Induced X-ray Emission) and SPM (Scanning Proton Microprobe) that are free of image artifacts due to continuum background and overlap with X-ray lines and detection response features (i.e. tails and escape peaks) from other elements. Been tested using samples that display complex multi-element overlaps, this method successfully projecting the accurate images for elements obscured by the lines of interfering elements.