首页> 外文会议>China-Japan joint symposium on accelerators for nuclear science and their applications; 19961021-23; Chengdu(CN) >RECENT DEVELOPMENTS IN TRUE-ELEMENTAL IMAGING ON THE FUDAN SCANNING PROTON MICROPROBE
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RECENT DEVELOPMENTS IN TRUE-ELEMENTAL IMAGING ON THE FUDAN SCANNING PROTON MICROPROBE

机译:复旦扫描质子微探针在真元素成像方面的最新进展

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Many efforts have been paid for the production of true-elemental images using PIXE (Proton Induced X-ray Emission) and SPM (Scanning Proton Microprobe) that are free of image artifacts due to continuum background and overlap with X-ray lines and detection response features (i.e. tails and escape peaks) from other elements. Been tested using samples that display complex multi-element overlaps, this method successfully projecting the accurate images for elements obscured by the lines of interfering elements.
机译:使用PIXE(质子诱导的X射线发射)和SPM(扫描质子微探针)制作真实元素图像已经付出了很多努力,这些元素由于连续的背景以及与X射线线和检测响应的重叠而没有图像伪影其他元素的特征(例如尾巴和逃逸峰)。通过使用显示复杂的多元素重叠的样本进行测试,该方法成功地为被干扰元素线遮盖的元素投影了准确的图像。

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