用薄靶厚衬底方法测量电子碰撞引起的K壳层电离截面

摘要

K-shell ionization cross sections of Ti and V elements from themeasured result of Kα X-rays using the spectrometer are derived. In order to overcome the difficulties in preparing thin target, a new method of thin target with thick substrate is used. The influence of electrons reflected from the aluminium substrate is corrected by a electron transport calculation.The measurement data from this work are compared with calculation result of semiempirical formula of Green et al, and measurement data of Jessenberger et al.%用能谱仪测量特征X射线，从而导出元素钛和钒的K壳层电离截面。为克服制靶困难，实验中采用薄靶厚衬底方法。通过电子输运计算，由厚衬底产生的反射电子对计数的影响得以修正。将结果和Green等的半经验公式以及Jessenberger等的测量数据进行了比较。